soxs_spatial_solution¶
The soxs_spatial_solution recipe enhances the wavelength solution achieved with soxs_disp_solution by expanding the solution into the spatial dimension (along the slit). The resulting 2-dimensional solution accounts for any tilt in the spectral lines relative to the cross-dispersion axis. The recipe is similar in logic to soxs_disp_solution, but now samples arc lines along the slit in the cross-dispersion direction using a multi-pinhole slit mask.
Usage¶
The soxs_spatial_solution recipe can be run with the following convention:
soxspipe [-Vx] spat_solution <inputFrames> [-o <outputDirectory> -s <pathToSettingsFile> --poly=<oowwss>]
To rerun a previously executed soxs_spatial_solution recipe, you can find the execution command at the end of the recipe log file (found in the workspace products/soxs_spatial_solution directory). Use the -x flag to overwrite the product files if they already exist. For example, from the root of your workspace, you would run a command like:
soxspipe spat_solution sof/20260111T095625_NIR_3_SSOL_MULTPIN_15_0S_SOXS.sof -s ./sessions/base/soxspipe.yaml -x
While the default polynomial fitting orders have been carefully tuned to robustly reduce most data, it is possible to execute this recipe while providing the dispersion-solution polynomial fitting orders through the command line, with command line settings overriding those in the YAML settings file. For instance, to attempt a dispersion solution fit using 3rd (x) and 4th-order (y) spectral-order (oo) component, a 5th-order (for both x and y) wavelength (ww) component, and a 2nd (x) and 4th-order (y) slit-position component (ss):
soxspipe spat_solution sof/20260111T095625_NIR_3_SSOL_MULTPIN_15_0S_SOXS.sof -s ./sessions/base/soxspipe.yaml --poly=345524
To adjust the default settings for the soxs_spatial_solution recipe, open the soxspipe.yaml file referenced in the command above in a text editor, navigate to the soxs_spatial_solution dictionary, save the file and rerun the recipe command. The settings’ descriptions can be found in Table 22.
Product files are written in the products/soxs_spatial_solution, and QC plots are in the qc/soxs_spatial_solution workspace directory. A report of the product files, QC plots and metrics is also printed to the terminal. The QC metrics calculated for soxs_spatial_solution are found in soxs_spatial_solution_qc and a typical QC plot in soxs_spatial_solution_qc_fig.
Reduction Tips¶
If this recipe fails because a fit for the dispersion solution is not found, the first parameter to adjust is poly-fitting-residual-clipping-sigma. Try setting a value lower than the default value by 0.5 and running the recipe again. If the recipe still fails, repeat the reduction in steps of 0.5 down to 3 sigma.
You can also try adjusting the polynomial fitting orders in order-deg and wavelength-deg. However, please be advised the pipeline itself will dynamically adjust these values if they fail to fit the default set. It will slowly reduce the orders and refit until it finds a fit or decides a fit can not be found (after five iterations of decreasing the orders).
Parameters¶
Parameter |
Description |
Type |
Entry Point |
Related Util |
|---|---|---|---|---|
|
divide image by master flat frame |
bool |
settings |
- |
|
fit and subtract the intra-order background light |
bool |
settings |
|
|
the size of the square window used to search for an arc-lamp emission line, centred on the predicted pixel position of the line |
int |
settings |
|
|
minimum significance required for arc-line to be considered ‘detected’ |
float |
settings |
|
|
degree of echelle order number component of global polynomial fit to the dispersion solution [x, y] |
int/list |
settings file or command-line |
|
|
degree of wavelength component of global polynomial fit to the dispersion solution [x, y] |
int/list |
settings file or command-line |
|
|
degree of slit position component of global polynomial fit to the dispersion solution [x, y] |
int/list |
settings file or command-line |
|
|
number of sigma-clipping iterations to perform before settings on a polynomial fit for the dispersion solution |
int |
settings |
|
|
sigma clipping limit when fitting global polynomial to the dispersion solution |
float |
settings |
|
|
clipping performed on multi-pinhole sets (true) or individual pinholes (false) |
bool |
settings |
|
|
maximum distance allowed from the pixel centre when calculating wavelength, order and slit-position for 2d disp-sol image |
float |
settings |
|
|
full multi-pinholes sets (same arc line) with fewer than mph_line_set_min lines detected get clipped |
int |
settings |
|
|
degree of bsplines used to fit the inter-order background (if |
int |
settings file |
|
|
Standard deviation of Gaussian kernel used to smooth background image (if |
int |
settings file |
Input¶
Data Type |
Content |
Related OB |
|---|---|---|
FITS Image |
Arc Lamp through multi-pinhole mask |
|
FITS Image |
Master Dark Frame (VIS only, optional) |
- |
FITS Image |
Master Bias Frame (VIS only) |
- |
FITS Image |
Master Flat Frame (optional) |
- |
FITS Image |
Dark frame (Lamp-Off) of equal exposure length as multi-pinhole frame (Lamp-On) (NIR only) |
|
FITS Table |
First-guess Dispersion map table |
Output¶
Label |
Content |
Data Type |
PRO CATG |
PRO TYPE |
PRO TECH |
|---|---|---|---|---|---|
|
Full dispersion-spatial solution |
FITS |
|
|
|
|
2D detector map of wavelength, slit position and order |
FITS |
|
|
|
|
Fitted intra-order image background |
- |
- |
- |
|
|
Dispersion solution fitted lines |
FITS |
- |
- |
- |
|
Undetected arc lines |
FITS |
- |
- |
- |
|
Dispersion solution QC plots |
- |
- |
- |
QC Metrics¶
Label |
Description |
Unit |
Acceptable Range |
|---|---|---|---|
|
Total number of detected lines clipped during solution fitting |
lines |
- |
|
Number of lines detected in single pinhole frame |
lines |
- |
|
Proportion of input line-list lines detected on single pinhole frame |
VIS: [0.95,1.0] |
|
|
Total number of line in single line-list |
lines |
- |
|
Proportion of good, unclipped lines in single pinhole frame |
lines |
VIS: [0.55,1.0] NIR: [0.4,1.0] |
|
The minimum number of pinholes found across all orders (should be 9) |
pinholes |
VIS: 9, NIR: 9 |
|
Maximum residual in fitting of pinholes along x-axis (global) |
pixels |
- |
|
Minimum residual in fitting of pinholes along x-axis (global) |
pixels |
- |
|
Median of absolute residuals in fitting of pinholes along x-axis (global) |
pixels |
- |
|
Std-dev of residuals in fitting of pinholes along x-axis (global) |
pixels |
VIS: [0,0.25], NIR: [0,0.42] |
|
Maximum residual in fitting of pinholes along y-axis (global) |
pixels |
- |
|
Minimum residual in fitting of pinholes along y-axis (global) |
pixels |
- |
|
Median of absolute residuals in fitting of pinholes along y-axis (global) |
pixels |
- |
|
Std-dev of residuals in fitting of pinholes along y-axis (global) |
pixels |
VIS: [0,0.48], NIR: [0,0.12] |
|
Maximum residual in fitting of pinholes (global) |
pixels |
- |
|
Minimum residual in fitting of pinholes (global) |
pixels |
- |
|
Median residual in fitting of pinholes (global) |
pixels |
VIS: [0,0.7], NIR: [0,0.3] |
|
Std-dev of residuals in fitting of pinholes (global) |
pixels |
VIS: [0,0.5], NIR: [0,0.4] |
|
Median difference between observed and predicted pinhole detector locations along the x-axis (global) |
pixels |
- |
|
Standard deviation in difference between observed and predicted pinhole detector locations along the x-axis (global) |
pixels |
- |
|
SMedian difference between observed and predicted pinhole detector locations along the y-axis (global) |
pixels |
- |
|
Standard deviation in difference between observed and predicted pinhole detector locations along the y-axis (global) |
pixels |
- |
|
Median difference between observed and predicted pinhole detector locations (global) |
pixels |
- |
|
Standard deviation of difference between observed and predicted pinhole detector locations (global) |
pixels |
- |
|
Median FWHM of detected lines in pinhole frames (global) |
pixels |
VIS: [1.60,1.72], NIR: [1.55,1.85] |
|
Standard deviation in FWHM of detected lines in pinhole frames (global) |
pixels |
VIS: [0.0,0.16], NIR: [0.0,0.145] |
|
Median spectral resolution measured from detected lines in pinhole frames (global) |
- |
|
|
Maximum residual in fitting of pinholes along x-axis (order N) |
pixels |
- |
|
Minimum residual in fitting of pinholes along x-axis (order N) |
pixels |
- |
|
Median of absolute residuals in fitting of pinholes along x-axis (order N) |
pixels |
- |
|
Std-dev of residuals in fitting of pinholes along x-axis (order N) |
pixels |
- |
|
Maximum residual in fitting of pinholes along y-axis (order N) |
pixels |
- |
|
Minimum residual in fitting of pinholes along y-axis (order N) |
pixels |
- |
|
Median of absolute residuals in fitting of pinholes along y-axis (order N) |
pixels |
- |
|
Std-dev of residuals in fitting of pinholes along y-axis (order N) |
pixels |
- |
|
Maximum residual in fitting of pinholes (order N) |
pixels |
- |
|
Minimum residual in fitting of pinholes (order N) |
pixels |
- |
|
Std-dev of residuals in fitting of pinholes along (order N) |
pixels |
- |
|
Median difference between observed and predicted pinhole detector locations along the x-axis (order N) |
pixels |
- |
|
Standard deviation in difference between observed and predicted pinhole detector locations along the x-axis (order N) |
pixels |
- |
|
SMedian difference between observed and predicted pinhole detector locations along the y-axis (order N) |
pixels |
- |
|
Standard deviation in difference between observed and predicted pinhole detector locations along the y-axis (order N) |
pixels |
- |
|
Median difference between observed and predicted pinhole detector locations (order N) |
pixels |
- |
|
Median FWHM of detected lines in pinhole frames (order N) |
pixels |
- |
|
Standard-deviation in FWHM of detected lines in pinhole frames (order N) |
pixels |
- |
|
Median spectral resolution measured from detected lines in pinhole frames (order N) |
- |
Fig. 16 A QC plot resulting from the soxs_spatial_solution recipe. The top-left panel shows an SOXS VIS arc-lamp frame, taken with a multi-pinhole mask. The green circles represent arc lines detected in the image, and the blue circles and red crosses are lines that were detected but dropped because other pinholes of the same arc line were not detected, or because the lines were clipped during polynomial fitting. The grey circles represent arc lines reported in the static calibration table that were not detected in the image. The bottom-left panel shows the same arc-lamp frame with the dispersion solution overlaid as a blue grid. Lines travelling along the dispersion axis (left to right) are lines of equal slit position, and lines travelling in the cross-dispersion direction (top to bottom) are lines of equal wavelength. The top-right panel shows the residuals of the dispersion solution fit, and the bottom-right panel shows the resolution measured for each line (projected through the pinhole mask), with different colours for each echelle order and the mean order resolution in black.¶